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Interaction of Microwaves with Photoelectrons in Semiconductors
R. K. Ahrenkiel
,
S. W. Johnston
Materials Science
Research output
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Contribution to journal
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Article
›
peer-review
12
Scopus Citations
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Engineering
Penetration Depth
100%
Photoelectron
100%
Lifetime Measurement
50%
Recombination Lifetime
50%
Carrier Concentration
50%
Reflectance
50%
Material Science
Carrier Concentration
100%