Abstract
Electrical, chemical and compositional microcharacterization techniques are used to investigate and evaluate the operation of the CdS and Cd(Zn)S/CuInSe//2 solar cell. Surface analysis methods (scanning AES, EELS, SIMS, XPS) and microelectrical characterization (EBIC) are used to study the correlated compositional and electronic properties of the films and interfaces controlling the performance of the device.
Original language | American English |
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Pages (from-to) | 1137-1146 |
Number of pages | 10 |
Journal | Scanning Electron Microscopy |
Volume | v |
Issue number | III |
State | Published - 1983 |
Externally published | Yes |
Bibliographical note
Work performed by Solar Energy Research Institute, Golden, Colorado and JEOL U.S.A. Inc., Peabody, MassachusettsNREL Publication Number
- ACNR/JA-213-3354