Interface Activity in CdS/CuInSe2 Thin-Film Solar Cells

L. L. Kazmerski, T. P. Massopust, P. J. Ireland, O. Jamjoum, R. J. Matson, A. Hermann, J. R. Dick, P. E. Russell

Research output: Contribution to journalArticlepeer-review

6 Scopus Citations


Electrical, chemical and compositional microcharacterization techniques are used to investigate and evaluate the operation of the CdS and Cd(Zn)S/CuInSe//2 solar cell. Surface analysis methods (scanning AES, EELS, SIMS, XPS) and microelectrical characterization (EBIC) are used to study the correlated compositional and electronic properties of the films and interfaces controlling the performance of the device.

Original languageAmerican English
Pages (from-to)1137-1146
Number of pages10
JournalScanning Electron Microscopy
Issue numberIII
StatePublished - 1983
Externally publishedYes

Bibliographical note

Work performed by Solar Energy Research Institute, Golden, Colorado and JEOL U.S.A. Inc., Peabody, Massachusetts

NREL Publication Number

  • ACNR/JA-213-3354


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