Abstract
Advancing CdTe solar cell efficiency requires improving the open-circuit voltage (VOC) above 900 mV. This requires long carrier lifetime, high hole density, and high-quality interfaces, where the interface recombination velocity is less than about 104 cm/s. Using CdTe single crystals as a model system, we report on CdTe/CdS electrical and structural interface properties in devices that produce open-circuit voltage exceeding 950 mV.
| Original language | American English |
|---|---|
| Pages (from-to) | 1650-1653 |
| Number of pages | 4 |
| Journal | IEEE Journal of Photovoltaics |
| Volume | 6 |
| Issue number | 6 |
| DOIs | |
| State | Published - Nov 2016 |
Bibliographical note
Publisher Copyright:© 2016 IEEE.
NREL Publication Number
- NREL/JA-5K00-65799
Keywords
- Characterization of defects in photovoltaic (PV)
- CIGS and CdTe thin-film solar cells
- microstructure