Interfacial Layer Growth Condition Dependent Carrier Transport Mechanisms in HfO2/SiO2 Gate Stacks: Article No. 232903

Santosh Sahoo

Research output: Contribution to journalArticlepeer-review

Original languageAmerican English
Number of pages5
JournalApplied Physics Letters
Volume100
Issue number23
DOIs
StatePublished - 2012

NREL Publication Number

  • NREL/JA-5200-55812

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