Abstract
The μm-scale spatial distribution of the elements of polycrystalline Cu(In 1-xGa x)Se 2 absorber surfaces is examined using x-ray photoelectron emission microscopy. The chemical composition varies from grain to grain, and a direct, linear anticorrelation between the In 3d and Ga 2p photoemission line intensities is observed. The line intensities are interpreted in terms of a varying value of x = Ga/(In Ga); the band gaps calculated from the inferred compositions of the grains are shown to be normally distributed with a standard deviation of 40 meV.
Original language | American English |
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Article number | 103908 |
Number of pages | 4 |
Journal | Applied Physics Letters |
Volume | 101 |
Issue number | 10 |
DOIs | |
State | Published - 3 Sep 2012 |
NREL Publication Number
- NREL/JA-5200-56824