Intergrain Variations of the Chemical and Electronic Surface Structure of Polycrystalline Cu(In,Ga)Se2 Thin-Film Solar Cell Absorbers

R. G. Wilks, I. Repins, M. A. Contreras, R. Félix, J. Herrero-Albillos, L. Tati-Bismaths, F. Kronast, R. Noufi, M. Bär

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Abstract

The μm-scale spatial distribution of the elements of polycrystalline Cu(In 1-xGa x)Se 2 absorber surfaces is examined using x-ray photoelectron emission microscopy. The chemical composition varies from grain to grain, and a direct, linear anticorrelation between the In 3d and Ga 2p photoemission line intensities is observed. The line intensities are interpreted in terms of a varying value of x = Ga/(In Ga); the band gaps calculated from the inferred compositions of the grains are shown to be normally distributed with a standard deviation of 40 meV.

Original languageAmerican English
Article number103908
Number of pages4
JournalApplied Physics Letters
Volume101
Issue number10
DOIs
StatePublished - 3 Sep 2012

NREL Publication Number

  • NREL/JA-5200-56824

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