Abstract
Presented at the 2001 NCPV Program Review Meeting: Using methods of elastic properties to study disorder of thin silicon films.
Original language | American English |
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Number of pages | 4 |
State | Published - 2001 |
Event | NCPV Program Review Meeting - Lakewood, Colorado Duration: 14 Oct 2001 → 17 Oct 2001 |
Conference
Conference | NCPV Program Review Meeting |
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City | Lakewood, Colorado |
Period | 14/10/01 → 17/10/01 |
NREL Publication Number
- NREL/CP-520-31038
Keywords
- amorphous
- hydrogen
- internal friction
- nanocrystalline
- silicon