Interpretation of Laser Scans from Thin-Film Polycrystalline Photovoltaic Modules

I. L. Eisgruber; R. J. Matson; J. R. Sites; K. A. Emery

Interpretation of Laser Scans from Thin-Film Polycrystalline Photovoltaic Modules

I. L. Eisgruber, R. J. Matson, J. R. Sites, K. A. Emery

Colorado State University

Research output: Contribution to conference › Paper › peer-review

13 Scopus Citations

Abstract

Laser scanning of photovoltaic devices and modules with submillimeter resolution can provide valuable information about localized defects and cell-to-cell variations in response. There are, however, sources of possible errors, or artifacts, in interpretation that must be addressed, especially when series-connected cells are scanned. These issues are addressed for thin film CdTe and CuInSe₂ (CIS) modules and cells using a recently developed computer-controlled larger-scale laser scanner at the National Renewable Energy Laboratory (NREL). This instrument was designed to serve as a tool for research, device and module quality control, and module failure analysis. The thrust of the report is twofold: i) the development of reliable submillimeter module characterization techniques and analysis and ii) present the results of such techniques as applied to thin film CdTe and CIS modules.

Original language	American English
Pages	283-286
Number of pages	4
State	Published - 1994
Externally published	Yes
Event	Proceedings of the 24th IEEE Photovoltaic Specialists Conference. Part 2 (of 2) - Waikoloa, HI, USA Duration: 5 Dec 1994 → 9 Dec 1994

Conference

Conference	Proceedings of the 24th IEEE Photovoltaic Specialists Conference. Part 2 (of 2)
City	Waikoloa, HI, USA
Period	5/12/94 → 9/12/94

Bibliographical note

Work performed by Colorado State University, Fort Collins, Colorado and the National Renewable Energy Laboratory, Golden, Colorado

NREL Publication Number

NREL/CP-412-6834

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Cite this

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title = "Interpretation of Laser Scans from Thin-Film Polycrystalline Photovoltaic Modules",

abstract = "Laser scanning of photovoltaic devices and modules with submillimeter resolution can provide valuable information about localized defects and cell-to-cell variations in response. There are, however, sources of possible errors, or artifacts, in interpretation that must be addressed, especially when series-connected cells are scanned. These issues are addressed for thin film CdTe and CuInSe2 (CIS) modules and cells using a recently developed computer-controlled larger-scale laser scanner at the National Renewable Energy Laboratory (NREL). This instrument was designed to serve as a tool for research, device and module quality control, and module failure analysis. The thrust of the report is twofold: i) the development of reliable submillimeter module characterization techniques and analysis and ii) present the results of such techniques as applied to thin film CdTe and CIS modules.",

author = "Eisgruber, {I. L.} and Matson, {R. J.} and Sites, {J. R.} and Emery, {K. A.}",

note = "Work performed by Colorado State University, Fort Collins, Colorado and the National Renewable Energy Laboratory, Golden, Colorado; Proceedings of the 24th IEEE Photovoltaic Specialists Conference. Part 2 (of 2) ; Conference date: 05-12-1994 Through 09-12-1994",

year = "1994",

language = "American English",

pages = "283--286",

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TY - CONF

T1 - Interpretation of Laser Scans from Thin-Film Polycrystalline Photovoltaic Modules

AU - Eisgruber, I. L.

AU - Matson, R. J.

AU - Sites, J. R.

AU - Emery, K. A.

N1 - Work performed by Colorado State University, Fort Collins, Colorado and the National Renewable Energy Laboratory, Golden, Colorado

PY - 1994

Y1 - 1994

N2 - Laser scanning of photovoltaic devices and modules with submillimeter resolution can provide valuable information about localized defects and cell-to-cell variations in response. There are, however, sources of possible errors, or artifacts, in interpretation that must be addressed, especially when series-connected cells are scanned. These issues are addressed for thin film CdTe and CuInSe2 (CIS) modules and cells using a recently developed computer-controlled larger-scale laser scanner at the National Renewable Energy Laboratory (NREL). This instrument was designed to serve as a tool for research, device and module quality control, and module failure analysis. The thrust of the report is twofold: i) the development of reliable submillimeter module characterization techniques and analysis and ii) present the results of such techniques as applied to thin film CdTe and CIS modules.

AB - Laser scanning of photovoltaic devices and modules with submillimeter resolution can provide valuable information about localized defects and cell-to-cell variations in response. There are, however, sources of possible errors, or artifacts, in interpretation that must be addressed, especially when series-connected cells are scanned. These issues are addressed for thin film CdTe and CuInSe2 (CIS) modules and cells using a recently developed computer-controlled larger-scale laser scanner at the National Renewable Energy Laboratory (NREL). This instrument was designed to serve as a tool for research, device and module quality control, and module failure analysis. The thrust of the report is twofold: i) the development of reliable submillimeter module characterization techniques and analysis and ii) present the results of such techniques as applied to thin film CdTe and CIS modules.

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M3 - Paper

AN - SCOPUS:0028718234

SP - 283

EP - 286

T2 - Proceedings of the 24th IEEE Photovoltaic Specialists Conference. Part 2 (of 2)

Y2 - 5 December 1994 through 9 December 1994

ER -

Interpretation of Laser Scans from Thin-Film Polycrystalline Photovoltaic Modules

Abstract

Conference

Bibliographical note

NREL Publication Number

UN SDGs

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