Inverted GaInP/(In)GaAs/InGaAs Triple-Junction Solar Cells with Low-Stress Metamorphic Bottom Junctions: Preprint

Research output: Contribution to conferencePaper

Abstract

We demonstrate high efficiency performance in two ultra-thin, Ge-free III-V semiconductor triple-junction solar cell device designs grown in an inverted configuration. Low-stress metamorphic junctions were engineered to achieve excellent photovoltaic performance with less than 3 x 106 cm-2 threading dislocations. The first design with band gaps of 1.83/1.40/1.00 eV, containing a singlemetamorphic junction, achieved 33.8% and 39.2% efficiencies under the standard one-sun global spectrum and concentrated direct spectrum at 131 suns, respectively. The second design with band gaps of 1.83/1.34/0.89 eV, containing two metamorphic junctions achieved 33.2% and 40.1% efficiencies under the standard one-sun global spectrum and concentrated direct spectrum at 143 suns, respectively.
Original languageAmerican English
Number of pages8
StatePublished - 2008
Event33rd IEEE Photovoltaic Specialists Conference - San Diego, California
Duration: 11 May 200816 May 2008

Conference

Conference33rd IEEE Photovoltaic Specialists Conference
CitySan Diego, California
Period11/05/0816/05/08

NREL Publication Number

  • NREL/CP-520-42547

Keywords

  • GE Free
  • high efficiency
  • inverted configuration
  • low-stress
  • metamorphic junction
  • PV
  • semiconductor
  • solar cells
  • solar spectrum
  • triple-junction

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