Investigating Minority-Carrier Traps in p-type Cu(InGa)Se2 Using Deep Level Transient Spectroscopy

    Research output: Contribution to conferencePaper

    Original languageAmerican English
    Pages237-242
    Number of pages6
    StatePublished - 2005
    EventThin-Film Compound Semiconductor Photovoltaics: Materials Research Society Symposium - San Francisco, California
    Duration: 29 Mar 20051 Apr 2005

    Conference

    ConferenceThin-Film Compound Semiconductor Photovoltaics: Materials Research Society Symposium
    CitySan Francisco, California
    Period29/03/051/04/05

    NREL Publication Number

    • NREL/CP-520-37768

    Keywords

    • CGS
    • CIGS
    • CIS
    • deep level transient spectroscopy (DLTS)
    • high efficiencies
    • minority-carrier traps
    • solar cells

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