Investigation of Charge Trapping at Grain Boundaries in Polycrystalline and Multicrystalline Silicon Solar Cells: Paper No. 1268-EE07-10

Chun Sheng Jiang; Jennifer Heath

doi:10.1557/PROC-1268-EE07-10

Investigation of Charge Trapping at Grain Boundaries in Polycrystalline and Multicrystalline Silicon Solar Cells: Paper No. 1268-EE07-10

Chun Sheng Jiang
, Jennifer Heath

Research output: Contribution to conference › Paper

Original language	American English
Pages	25-30
Number of pages	6
DOIs	https://doi.org/10.1557/PROC-1268-EE07-10
State	Published - 2010
Event	Materials Research Society Symposium - San Francisco, California Duration: 5 Apr 2010 → 9 Apr 2010

Conference

Conference	Materials Research Society Symposium
City	San Francisco, California
Period	5/04/10 → 9/04/10

NLR Publication Number

NREL/CP-520-47978

Keywords

cell efficiency
device performance
solar cells

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10.1557/PROC-1268-EE07-10

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title = "Investigation of Charge Trapping at Grain Boundaries in Polycrystalline and Multicrystalline Silicon Solar Cells: Paper No. 1268-EE07-10",

keywords = "cell efficiency, device performance, solar cells",

author = "Jiang, \{Chun Sheng\} and Jennifer Heath",

year = "2010",

doi = "10.1557/PROC-1268-EE07-10",

language = "American English",

pages = "25--30",

note = "Materials Research Society Symposium ; Conference date: 05-04-2010 Through 09-04-2010",

}

TY - CONF

T1 - Investigation of Charge Trapping at Grain Boundaries in Polycrystalline and Multicrystalline Silicon Solar Cells

T2 - Materials Research Society Symposium

AU - Jiang, Chun Sheng

AU - Heath, Jennifer

PY - 2010

Y1 - 2010

KW - cell efficiency

KW - device performance

KW - solar cells

UR - https://www.scopus.com/pages/publications/79951593906

U2 - 10.1557/PROC-1268-EE07-10

DO - 10.1557/PROC-1268-EE07-10

M3 - Paper

SP - 25

EP - 30

Y2 - 5 April 2010 through 9 April 2010

ER -

Investigation of Charge Trapping at Grain Boundaries in Polycrystalline and Multicrystalline Silicon Solar Cells: Paper No. 1268-EE07-10

Conference

NLR Publication Number

Keywords

Access to Document

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