Investigation of Correlation between Field Performance and Indoor Acceleration Measurements of Potential Induced Degradation (PID) for c-Si PV Modules

Christopher Deline, Peter Hacke, Sarah Kurtz, Yifeng Chen, Kaitlyn VanSant, Yong Khoo, Zigang Wang, Jing Chai, Li Yin, Yan Wang, Armin Aberle, Yang Yang, Pietro Altermatt, Zhiqiang Feng, Pierre Verlinden

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