Investigation of Effects of Processing and Impurities on the Properties of CdTe Using Microscopic Two-Dimensional Photoluminescence Imaging Technique

Ramesh Dhere

doi:10.1109/PVSC.2009.5411317

Investigation of Effects of Processing and Impurities on the Properties of CdTe Using Microscopic Two-Dimensional Photoluminescence Imaging Technique

Ramesh Dhere

National Renewable Energy Laboratory

Research output: Contribution to conference › Paper

Original language	American English
Pages	001443-001447
Number of pages	5
DOIs	https://doi.org/10.1109/PVSC.2009.5411317
State	Published - 2009
Event	34th IEEE Photovoltaic Specialists Conference (PVSC '09) - Philadelphia, Pennsylvania Duration: 7 Jun 2009 → 12 Jun 2009

Conference

Conference	34th IEEE Photovoltaic Specialists Conference (PVSC '09)
City	Philadelphia, Pennsylvania
Period	7/06/09 → 12/06/09

NREL Publication Number

NREL/CP-520-46062

Keywords

cameras
chemicals
glass
grain boundaries
heat treatment
impurities
microscopy
photoluminescence
surface treatment
tellurium

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10.1109/PVSC.2009.5411317

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title = "Investigation of Effects of Processing and Impurities on the Properties of CdTe Using Microscopic Two-Dimensional Photoluminescence Imaging Technique",

keywords = "cameras, chemicals, glass, grain boundaries, heat treatment, impurities, microscopy, photoluminescence, surface treatment, tellurium",

author = "Ramesh Dhere",

year = "2009",

doi = "10.1109/PVSC.2009.5411317",

language = "American English",

pages = "001443--001447",

note = "34th IEEE Photovoltaic Specialists Conference (PVSC '09) ; Conference date: 07-06-2009 Through 12-06-2009",

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AU - Dhere, Ramesh

PY - 2009

Y1 - 2009

KW - cameras

KW - chemicals

KW - glass

KW - grain boundaries

KW - heat treatment

KW - impurities

KW - microscopy

KW - photoluminescence

KW - surface treatment

KW - tellurium

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DO - 10.1109/PVSC.2009.5411317

M3 - Paper

SP - 1443

EP - 1447

T2 - 34th IEEE Photovoltaic Specialists Conference (PVSC '09)

Y2 - 7 June 2009 through 12 June 2009

ER -

Investigation of Effects of Processing and Impurities on the Properties of CdTe Using Microscopic Two-Dimensional Photoluminescence Imaging Technique

Conference

NREL Publication Number

Keywords

Access to Document

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