Investigation of Electrical Degradation Effects in Ferroelectric Thin Film Based Tunable Microwave Components

Konstantin Astafiev; Vladimir Sherman; Alexander Tagantsev; Nava Setter; Tatyana Rivkin; David Ginley

doi:10.1080/713718369

Investigation of Electrical Degradation Effects in Ferroelectric Thin Film Based Tunable Microwave Components

Konstantin Astafiev, Vladimir Sherman, Alexander Tagantsev, Nava Setter, Tatyana Rivkin, David Ginley

Materials, Chemical, and Computational Science

Research output: Contribution to journal › Article › peer-review

5 Scopus Citations

Abstract

The impact of electrical stressing on the microwave performance of the SrTiO₃ films deposited onto different substrates (MgO and LaAlO ₃) by pulsed laser deposition has been investigated. The most important characteristics of the tunable microwave components like tunability and loss tangent have been monitored. It has been found that electrical degradation effects, being sensitive to the device operating conditions and ferroelectric film properties, are large enough to affect the performance of ferroelectric-based tunable microwave devices within the expected operating time.

Original language	American English
Pages (from-to)	103-112
Number of pages	10
Journal	Integrated Ferroelectrics
Volume	49
DOIs	https://doi.org/10.1080/713718369 https://doi.org/10.1080/713718369
State	Published - 2002

NREL Publication Number

NREL/JA-520-33868

Keywords

Degradation effects
Ferroelectric films
Microwave
Nonlinearity
Tunable devices

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title = "Investigation of Electrical Degradation Effects in Ferroelectric Thin Film Based Tunable Microwave Components",

abstract = "The impact of electrical stressing on the microwave performance of the SrTiO3 films deposited onto different substrates (MgO and LaAlO 3) by pulsed laser deposition has been investigated. The most important characteristics of the tunable microwave components like tunability and loss tangent have been monitored. It has been found that electrical degradation effects, being sensitive to the device operating conditions and ferroelectric film properties, are large enough to affect the performance of ferroelectric-based tunable microwave devices within the expected operating time.",

keywords = "Degradation effects, Ferroelectric films, Microwave, Nonlinearity, Tunable devices",

author = "Konstantin Astafiev and Vladimir Sherman and Alexander Tagantsev and Nava Setter and Tatyana Rivkin and David Ginley",

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doi = "10.1080/713718369",

language = "American English",

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T1 - Investigation of Electrical Degradation Effects in Ferroelectric Thin Film Based Tunable Microwave Components

AU - Astafiev, Konstantin

AU - Sherman, Vladimir

AU - Tagantsev, Alexander

AU - Setter, Nava

AU - Rivkin, Tatyana

AU - Ginley, David

PY - 2002

Y1 - 2002

N2 - The impact of electrical stressing on the microwave performance of the SrTiO3 films deposited onto different substrates (MgO and LaAlO 3) by pulsed laser deposition has been investigated. The most important characteristics of the tunable microwave components like tunability and loss tangent have been monitored. It has been found that electrical degradation effects, being sensitive to the device operating conditions and ferroelectric film properties, are large enough to affect the performance of ferroelectric-based tunable microwave devices within the expected operating time.

AB - The impact of electrical stressing on the microwave performance of the SrTiO3 films deposited onto different substrates (MgO and LaAlO 3) by pulsed laser deposition has been investigated. The most important characteristics of the tunable microwave components like tunability and loss tangent have been monitored. It has been found that electrical degradation effects, being sensitive to the device operating conditions and ferroelectric film properties, are large enough to affect the performance of ferroelectric-based tunable microwave devices within the expected operating time.

KW - Degradation effects

KW - Ferroelectric films

KW - Microwave

KW - Nonlinearity

KW - Tunable devices

UR - http://www.scopus.com/inward/record.url?scp=2142824423&partnerID=8YFLogxK

U2 - 10.1080/713718369

DO - 10.1080/713718369

M3 - Article

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VL - 49

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EP - 112

JO - Integrated Ferroelectrics

JF - Integrated Ferroelectrics

ER -

Investigation of Electrical Degradation Effects in Ferroelectric Thin Film Based Tunable Microwave Components

Abstract

NREL Publication Number

Keywords

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