Ion Scattering Spectroscopy and Auger Electron Spectroscopy Depth Profiles of Silver-Copper Thin Film Interdiffusion

    Research output: Contribution to journalArticle

    Original languageAmerican English
    Pages (from-to)1671-1674
    Number of pages4
    JournalJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
    Issue number3, Part II
    StatePublished - 1986

    NREL Publication Number

    • ACNR/JA-255-6543

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