Abstract
Large grain poly-Si thin films on glass substrates have been successfully fabricated. The film thickness was 400 nm and the grains sizes were in excess of several microns. The films were fabricated using aluminum-induced crystallization of a-Si:H in the presence of a silicon oxide layer at the Al/a-Si:H interface. The a-Si:H film was deposited on glass substrates and the annealing temperatures and annealing times were kept below 450°C and 30 minutes, respectively. The resulting poly-Si was heavily Al-doped.
Original language | American English |
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Pages | 1070-1073 |
Number of pages | 4 |
State | Published - 2005 |
Event | 31st IEEE Photovoltaic Specialists Conference - 2005 - Lake Buena Vista, FL, United States Duration: 3 Jan 2005 → 7 Jan 2005 |
Conference
Conference | 31st IEEE Photovoltaic Specialists Conference - 2005 |
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Country/Territory | United States |
City | Lake Buena Vista, FL |
Period | 3/01/05 → 7/01/05 |
NREL Publication Number
- NREL/CP-520-38899