Large Grain Poly-Si Thin Films by Metal Induced Crystallization of a-Si:H

Marwan A. Albarghouti, Husam H. Abu-Safe, Hameed A. Naseem, William D. Brown, Mowafak M. Al-Jassim, Kim M. Jones

Research output: Contribution to conferencePaperpeer-review

1 Scopus Citations

Abstract

Large grain poly-Si thin films on glass substrates have been successfully fabricated. The film thickness was 400 nm and the grains sizes were in excess of several microns. The films were fabricated using aluminum-induced crystallization of a-Si:H in the presence of a silicon oxide layer at the Al/a-Si:H interface. The a-Si:H film was deposited on glass substrates and the annealing temperatures and annealing times were kept below 450°C and 30 minutes, respectively. The resulting poly-Si was heavily Al-doped.

Original languageAmerican English
Pages1070-1073
Number of pages4
StatePublished - 2005
Event31st IEEE Photovoltaic Specialists Conference - 2005 - Lake Buena Vista, FL, United States
Duration: 3 Jan 20057 Jan 2005

Conference

Conference31st IEEE Photovoltaic Specialists Conference - 2005
Country/TerritoryUnited States
CityLake Buena Vista, FL
Period3/01/057/01/05

NREL Publication Number

  • NREL/CP-520-38899

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