Lateral Electron Transport in Cu(In,Ga)Se2 Investigated by Electro-Assisted Scanning Tunneling Microscopy

Manuel J. Romero; Chun Sheng Jiang; Rommel Noufi; Mowafak Al-Jassim

doi:10.1063/1.2119422

Lateral Electron Transport in Cu(In,Ga)Se2 Investigated by Electro-Assisted Scanning Tunneling Microscopy

Manuel J. Romero, Chun Sheng Jiang, Rommel Noufi, Mowafak Al-Jassim

Materials Science

National Renewable Energy Laboratory

Research output: Contribution to journal › Article › peer-review

22 Scopus Citations

Abstract

We investigate the lateral electron transport across grain boundaries in Cu (In,Ga) Se2 (CIGS) by a combination of scanning tunneling microscopy (STM) with the excitation provided by the electron beam in electron microscopy-or electro-assisted STM. Using this method, we report evidence for a significant barrier for electron diffusion across grain boundaries in CuGa Se2 (CGS), which is not present in CuIn Se2 (CIS). Finally, we discuss the effects of gallium addition.

Original language	American English
Article number	172106
Pages (from-to)	1-3
Number of pages	3
Journal	Applied Physics Letters
Volume	87
Issue number	17
DOIs	https://doi.org/10.1063/1.2119422 https://doi.org/10.1063/1.2119422
State	Published - 24 Oct 2005

NREL Publication Number

NREL/JA-520-38140

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title = "Lateral Electron Transport in Cu(In,Ga)Se2 Investigated by Electro-Assisted Scanning Tunneling Microscopy",

abstract = "We investigate the lateral electron transport across grain boundaries in Cu (In,Ga) Se2 (CIGS) by a combination of scanning tunneling microscopy (STM) with the excitation provided by the electron beam in electron microscopy-or electro-assisted STM. Using this method, we report evidence for a significant barrier for electron diffusion across grain boundaries in CuGa Se2 (CGS), which is not present in CuIn Se2 (CIS). Finally, we discuss the effects of gallium addition.",

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T1 - Lateral Electron Transport in Cu(In,Ga)Se2 Investigated by Electro-Assisted Scanning Tunneling Microscopy

AU - Romero, Manuel J.

AU - Jiang, Chun Sheng

AU - Noufi, Rommel

AU - Al-Jassim, Mowafak

PY - 2005/10/24

Y1 - 2005/10/24

N2 - We investigate the lateral electron transport across grain boundaries in Cu (In,Ga) Se2 (CIGS) by a combination of scanning tunneling microscopy (STM) with the excitation provided by the electron beam in electron microscopy-or electro-assisted STM. Using this method, we report evidence for a significant barrier for electron diffusion across grain boundaries in CuGa Se2 (CGS), which is not present in CuIn Se2 (CIS). Finally, we discuss the effects of gallium addition.

AB - We investigate the lateral electron transport across grain boundaries in Cu (In,Ga) Se2 (CIGS) by a combination of scanning tunneling microscopy (STM) with the excitation provided by the electron beam in electron microscopy-or electro-assisted STM. Using this method, we report evidence for a significant barrier for electron diffusion across grain boundaries in CuGa Se2 (CGS), which is not present in CuIn Se2 (CIS). Finally, we discuss the effects of gallium addition.

UR - https://www.scopus.com/pages/publications/28344434012

U2 - 10.1063/1.2119422

DO - 10.1063/1.2119422

M3 - Article

AN - SCOPUS:28344434012

SN - 0003-6951

VL - 87

SP - 1

EP - 3

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 17

M1 - 172106

ER -

Lateral Electron Transport in Cu(In,Ga)Se2 Investigated by Electro-Assisted Scanning Tunneling Microscopy

Abstract

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