Abstract
Thin films of crystalline and amorphous V2O3 were deposited by pulsed laser deposition (PLD) and the chemical diffusion coefficients, D, were measured by the potentiostatic intermittent titration technique (PITT). In crystalline V2O3 films, the maximum and minimum D were found to be 1.7 × 10-12 cm2/s and 5.8 × 10-15 cmVs respectively, with a general trend for D to rise in single-phase regions. The changes in D correlated well to the known phases in LixV2O5. In amorphous V2O5 films, D exhibited a smooth, continuous decrease as the Li concentration increased.
Original language | American English |
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Pages | 103-108 |
Number of pages | 6 |
DOIs | |
State | Published - 1999 |
Event | New Materials for Batteries and Fuel Cells: Materials Research Society Symposium - San Francisco, California Duration: 5 Apr 1999 → 8 Apr 1999 |
Conference
Conference | New Materials for Batteries and Fuel Cells: Materials Research Society Symposium |
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City | San Francisco, California |
Period | 5/04/99 → 8/04/99 |
NREL Publication Number
- NREL/CP-520-29035