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Light Bias CPM Study of the Density of States in n-Type Amorphous Silicon
NREL
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Dive into the research topics of 'Light Bias CPM Study of the Density of States in n-Type Amorphous Silicon'. Together they form a unique fingerprint.
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Engineering
Photocurrent
100%
Capture Cross Section
100%
Band Tail
100%
Absorption Coefficient
100%
Probe Beam
100%
Defect Absorption
100%
Valence Band
100%
Dangling Bond
100%
Electron Capture
100%
Physics
Density of States
100%
Amorphous Silicon
100%
Photoelectric Emission
50%
Absorption Spectra
50%
Absorption Cross Sections
50%
Monochromators
50%