Linking Transient Voltage to Spatially-Resolved Luminescence Imaging to Understand Reliability of Perovskite Photovoltaics: Preprint

Yasas Patikirige; Dana Sulas-Kern; Marco Nardone; Steve Johnston; Chuanxiao Xiao; Harvey Guthrey; Kai Zhu; Fei Zhang; Mowafak Al-Jassim

Linking Transient Voltage to Spatially-Resolved Luminescence Imaging to Understand Reliability of Perovskite Photovoltaics: Preprint

Yasas Patikirige, Dana Sulas-Kern, Marco Nardone, Steve Johnston, Chuanxiao Xiao, Harvey Guthrey, Kai Zhu, Fei Zhang, Mowafak Al-Jassim

Research output: Contribution to conference › Paper

Abstract

In this work, we present a methodology to separate effects of perovskite device metastability from irreversible degradation, using stress/rest cycling under constant current bias while collecting a series of electroluminescence images and continuously monitoring voltage. We develop a simulation model and procedures for image processing to better understand the effects of ion parameters on the transient nature of voltage and evolving electroluminescence images.

Original language	American English
Number of pages	8
State	Published - 2021
Event	48th IEEE Photovoltaic Specialists Conference (PVSC 48) - Duration: 20 Jun 2020 → 25 Jun 2020

Conference

Conference	48th IEEE Photovoltaic Specialists Conference (PVSC 48)
Period	20/06/20 → 25/06/20

Bibliographical note

See NREL/CP-5K00-81134 for paper as published in proceedings

NREL Publication Number

NREL/CP-5K00-80422

Keywords

luminescence imaging
perovskite
reliability
transient voltage

Access to Document

https://www.nrel.gov/docs/fy21osti/80422.pdf

Cite this

Patikirige, Y., Sulas-Kern, D., Nardone, M., Johnston, S., Xiao, C., Guthrey, H., Zhu, K., Zhang, F., & Al-Jassim, M. (2021). Linking Transient Voltage to Spatially-Resolved Luminescence Imaging to Understand Reliability of Perovskite Photovoltaics: Preprint. Paper presented at 48th IEEE Photovoltaic Specialists Conference (PVSC 48). https://www.nrel.gov/docs/fy21osti/80422.pdf

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title = "Linking Transient Voltage to Spatially-Resolved Luminescence Imaging to Understand Reliability of Perovskite Photovoltaics: Preprint",

abstract = "In this work, we present a methodology to separate effects of perovskite device metastability from irreversible degradation, using stress/rest cycling under constant current bias while collecting a series of electroluminescence images and continuously monitoring voltage. We develop a simulation model and procedures for image processing to better understand the effects of ion parameters on the transient nature of voltage and evolving electroluminescence images.",

keywords = "luminescence imaging, perovskite, reliability, transient voltage",

author = "Yasas Patikirige and Dana Sulas-Kern and Marco Nardone and Steve Johnston and Chuanxiao Xiao and Harvey Guthrey and Kai Zhu and Fei Zhang and Mowafak Al-Jassim",

note = "See NREL/CP-5K00-81134 for paper as published in proceedings; 48th IEEE Photovoltaic Specialists Conference (PVSC 48) ; Conference date: 20-06-2020 Through 25-06-2020",

year = "2021",

language = "American English",

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Patikirige, Y, Sulas-Kern, D, Nardone, M, Johnston, S, Xiao, C, Guthrey, H , Zhu, K, Zhang, F & Al-Jassim, M 2021, 'Linking Transient Voltage to Spatially-Resolved Luminescence Imaging to Understand Reliability of Perovskite Photovoltaics: Preprint', Paper presented at 48th IEEE Photovoltaic Specialists Conference (PVSC 48), 20/06/20 - 25/06/20. <https://www.nrel.gov/docs/fy21osti/80422.pdf>

TY - CONF

T1 - Linking Transient Voltage to Spatially-Resolved Luminescence Imaging to Understand Reliability of Perovskite Photovoltaics: Preprint

AU - Patikirige, Yasas

AU - Sulas-Kern, Dana

AU - Nardone, Marco

AU - Johnston, Steve

AU - Xiao, Chuanxiao

AU - Guthrey, Harvey

AU - Zhu, Kai

AU - Zhang, Fei

AU - Al-Jassim, Mowafak

N1 - See NREL/CP-5K00-81134 for paper as published in proceedings

PY - 2021

Y1 - 2021

N2 - In this work, we present a methodology to separate effects of perovskite device metastability from irreversible degradation, using stress/rest cycling under constant current bias while collecting a series of electroluminescence images and continuously monitoring voltage. We develop a simulation model and procedures for image processing to better understand the effects of ion parameters on the transient nature of voltage and evolving electroluminescence images.

AB - In this work, we present a methodology to separate effects of perovskite device metastability from irreversible degradation, using stress/rest cycling under constant current bias while collecting a series of electroluminescence images and continuously monitoring voltage. We develop a simulation model and procedures for image processing to better understand the effects of ion parameters on the transient nature of voltage and evolving electroluminescence images.

KW - luminescence imaging

KW - perovskite

KW - reliability

KW - transient voltage

M3 - Paper

T2 - 48th IEEE Photovoltaic Specialists Conference (PVSC 48)

Y2 - 20 June 2020 through 25 June 2020

ER -

Linking Transient Voltage to Spatially-Resolved Luminescence Imaging to Understand Reliability of Perovskite Photovoltaics: Preprint

Abstract

Conference

Bibliographical note

NREL Publication Number

Keywords

Access to Document

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