Lock-in Thermographic Shunt Detection and Analysis of Upgraded Metallurgical Grade Silicon Solar Cells

Research output: Contribution to conference › Paper

Original language	American English
Pages	134-137
Number of pages	4
State	Published - 2008
Event	18th Workshop on Crystalline Silicon Solar Cells and Modules: Materials and Processes - Vail, Colorado Duration: 3 Aug 2008 → 6 Aug 2008

Conference	18th Workshop on Crystalline Silicon Solar Cells and Modules: Materials and Processes
City	Vail, Colorado
Period	3/08/08 → 6/08/08

NLR Publication Number

@conference{b27cd2d5a8524316847bd766db2abe66,

title = "Lock-in Thermographic Shunt Detection and Analysis of Upgraded Metallurgical Grade Silicon Solar Cells",

keywords = "shunt detection, solar cells",

author = "Steven Johnston and Nathan Call and Bill Phan and Gregory Berman",

year = "2008",

language = "American English",

pages = "134--137",

note = "18th Workshop on Crystalline Silicon Solar Cells and Modules: Materials and Processes ; Conference date: 03-08-2008 Through 06-08-2008",

}

TY - CONF

T1 - Lock-in Thermographic Shunt Detection and Analysis of Upgraded Metallurgical Grade Silicon Solar Cells

AU - Johnston, Steven

AU - Call, Nathan

AU - Phan, Bill

AU - Berman, Gregory

PY - 2008

Y1 - 2008

KW - shunt detection

KW - solar cells

M3 - Paper

SP - 134

EP - 137

T2 - 18th Workshop on Crystalline Silicon Solar Cells and Modules: Materials and Processes

Y2 - 3 August 2008 through 6 August 2008

ER -