Luminescence and Thermal Imaging Applied to Half-Cut-Cell and Emitter-Wrap-Through-Cell Modules

Research output: Contribution to conferencePaper


Imaging techniques provide spatial details and visualization of module defects and degradation mechanisms that affect energy conversion efficiency and performance. We apply photoluminescence, electroluminescence, and dark lock-in thermography imaging techniques to evaluate new modules in their initial state and after applying stresses of damp heat, light-induced-degradation regeneration parameters, thermal cycling, and humidity-freeze cycles. One module uses emitter-wrap-through cells with back contacts connected to a metal-foil backplane, and the other is composed of half-cut cells. Imaging shows examples on non-uniform degradation and damage such as cells that degrade and recover under the applied conditions, cells with cracks and handling damage, and cells with increasing series resistance.
Original languageAmerican English
Number of pages6
StatePublished - 2023
Event50th IEEE PVSC - San Juan, Puerto Rico
Duration: 11 Jun 202316 Jun 2023


Conference50th IEEE PVSC
CitySan Juan, Puerto Rico

NREL Publication Number

  • NREL/CP-5K00-86467


  • degradation
  • imaging
  • infrared imaging
  • photoluminescence
  • photovoltaic cells
  • silicon
  • solar panels


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