@article{ee1f87529b4b4df49fc450279b546eca,
title = "Manufacturing Metrology for c-Si Module Reliability and Durability Part III: Module Manufacturing",
keywords = "bypass diode, durability, encapsulation, lamination, photovoltaic module reliability, silicon solar cells, stringing and tabbing",
author = "Eric Schneller and Paul Brooker and Narendra Shiradkar and Marianne Rodgers and Neelkanth Dhere and Kristopher Davis and Hubert Seigneur and Nahid Mohajeri and Giuseppe Scardera and Andrew Rudack and Winston Schoenfeld",
year = "2016",
doi = "10.1016/j.rser.2015.12.215",
language = "American English",
volume = "59",
pages = "992--1016",
journal = "Renewable and Sustainable Energy Reviews",
issn = "1364-0321",
publisher = "Elsevier Ltd.",
}