Abstract
This article is the first in a three-part series of manufacturing metrology for c-Si photovoltaic (PV) module reliability and durability. Here in Part 1 we focus on the three primary process steps for making silicon substrates for PV cells: (1) feedstock production; (2) ingot and brick production; and (3) wafer production. Each of these steps can affect the final reliability/durability of PV modules in the field with manufacturing metrology potentially playing a significant role. This article provides a comprehensive overview of historical and current processes in each of these three steps, followed by a discussion of associated reliability challenges and metrology strategies that can be employed for increased reliability and durability in resultant modules. Gaps in the current state of understanding in connective metrology data during processing to reliability/durability in the field are then identified along with suggested improvements that should be considered by the PV community.
Original language | American English |
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Pages (from-to) | 84-106 |
Number of pages | 23 |
Journal | Renewable and Sustainable Energy Reviews |
Volume | 59 |
DOIs | |
State | Published - 2016 |
NREL Publication Number
- NREL/JA-5J00-67052
Keywords
- crystalline silicon
- Czochralski
- directional solidification
- fluidized bed reactor
- kerfless
- Siemens
- wafer