Manufacturing Metrology for c-Si Photovoltaic Module Reliability and Durability, Part I: Feedstock, Crystallization and Wafering

Hubert Seigneur, Nahid Mohajeri, Paul Brooker, Kristopher Davis, Eric Schneller, Neelkanth Dhere, Marianne Rodgers, Narendra Shiradkar, Giuseppe Scardera, Andrew Rudack, Winston Schoenfeld

    Research output: Contribution to journalArticlepeer-review

    32 Scopus Citations

    Abstract

    This article is the first in a three-part series of manufacturing metrology for c-Si photovoltaic (PV) module reliability and durability. Here in Part 1 we focus on the three primary process steps for making silicon substrates for PV cells: (1) feedstock production; (2) ingot and brick production; and (3) wafer production. Each of these steps can affect the final reliability/durability of PV modules in the field with manufacturing metrology potentially playing a significant role. This article provides a comprehensive overview of historical and current processes in each of these three steps, followed by a discussion of associated reliability challenges and metrology strategies that can be employed for increased reliability and durability in resultant modules. Gaps in the current state of understanding in connective metrology data during processing to reliability/durability in the field are then identified along with suggested improvements that should be considered by the PV community.
    Original languageAmerican English
    Pages (from-to)84-106
    Number of pages23
    JournalRenewable and Sustainable Energy Reviews
    Volume59
    DOIs
    StatePublished - 2016

    NREL Publication Number

    • NREL/JA-5J00-67052

    Keywords

    • crystalline silicon
    • Czochralski
    • directional solidification
    • fluidized bed reactor
    • kerfless
    • Siemens
    • wafer

    Fingerprint

    Dive into the research topics of 'Manufacturing Metrology for c-Si Photovoltaic Module Reliability and Durability, Part I: Feedstock, Crystallization and Wafering'. Together they form a unique fingerprint.

    Cite this