Abstract
The relationship between lifetime measured by time-resolved photoluminescence on bare CIGS films and subsequent device performance is examined. A correlation between device voltage and lifetime is demonstrated. The effects of measured band gap and carrier density are discussed. Results are compared with fundamental calculations.
Original language | American English |
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Pages | 978-983 |
Number of pages | 6 |
DOIs | |
State | Published - 2009 |
Event | 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009 - Philadelphia, PA, United States Duration: 7 Jun 2009 → 12 Jun 2009 |
Conference
Conference | 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009 |
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Country/Territory | United States |
City | Philadelphia, PA |
Period | 7/06/09 → 12/06/09 |
NREL Publication Number
- NREL/CP-520-45884
Keywords
- CIGS films
- photovoltaic