Measured Minority-Carrier Lifetime and CIGS Device Performance

Ingrid L. Repins, Wyatt K. Metzger, Craig L. Perkins, Jian V. Li, Miguel A. Contreras

Research output: Contribution to conferencePaperpeer-review

23 Scopus Citations

Abstract

The relationship between lifetime measured by time-resolved photoluminescence on bare CIGS films and subsequent device performance is examined. A correlation between device voltage and lifetime is demonstrated. The effects of measured band gap and carrier density are discussed. Results are compared with fundamental calculations.

Original languageAmerican English
Pages978-983
Number of pages6
DOIs
StatePublished - 2009
Event2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009 - Philadelphia, PA, United States
Duration: 7 Jun 200912 Jun 2009

Conference

Conference2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009
Country/TerritoryUnited States
CityPhiladelphia, PA
Period7/06/0912/06/09

NREL Publication Number

  • NREL/CP-520-45884

Keywords

  • CIGS films
  • photovoltaic

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