Measurement of Recombination Parameters of Photovoltaic Materials by Resonant-Coupled Photoconductive Decay: Preprint

    Research output: Contribution to conferencePaper

    Abstract

    Presented at the 2001 NCPV Program Review Meeting: Novel contactless measurement technique that provides minority carrier lifetime, ambipolar mobility, and diffusion length.
    Original languageAmerican English
    Number of pages4
    StatePublished - 2001
    EventNCPV Program Review Meeting - Lakewood, Colorado
    Duration: 14 Oct 200117 Oct 2001

    Conference

    ConferenceNCPV Program Review Meeting
    CityLakewood, Colorado
    Period14/10/0117/10/01

    NREL Publication Number

    • NREL/CP-520-31028

    Keywords

    • contactless measurement
    • NCPV
    • photovoltaics (PV)
    • PV
    • resonant-coupled photoconductive decay (RCPCD)

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