Measurement of Recombination Parameters of Photovoltaic Materials by Resonant-Coupled Photoconductive Decay: Preprint

Research output: Contribution to conferencePaper

Abstract

Presented at the 2001 NCPV Program Review Meeting: Novel contactless measurement technique that provides minority carrier lifetime, ambipolar mobility, and diffusion length.
Original languageAmerican English
Number of pages4
StatePublished - 2001
EventNCPV Program Review Meeting - Lakewood, Colorado
Duration: 14 Oct 200117 Oct 2001

Conference

ConferenceNCPV Program Review Meeting
CityLakewood, Colorado
Period14/10/0117/10/01

NREL Publication Number

  • NREL/CP-520-31028

Keywords

  • contactless measurement
  • NCPV
  • photovoltaics (PV)
  • PV
  • resonant-coupled photoconductive decay (RCPCD)

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