Measurement of Semiconductor Surface Potential using the Scanning Electron Microscope: Article No. 046103

Research output: Contribution to journalArticlepeer-review

Original languageAmerican English
Number of pages3
JournalJournal of Applied Physics
Volume111
Issue number4
DOIs
StatePublished - 2012

NREL Publication Number

  • NREL/JA-5200-54747

Keywords

  • scanning electron microscope
  • semiconductor measurement
  • surface potential

Cite this