Measurement of Two Deep H Bonding Levels in Device Quality Glow Discharge a-Si:H

Research output: Contribution to conference › Paper

Original language	American English
Pages	413-418
Number of pages	6
State	Published - 1995
Event	Amorphous Silicon Technology 1995: Materials Research Society Symposium - San Francisco, California Duration: 18 Apr 1995 → 21 Apr 1995

Conference	Amorphous Silicon Technology 1995: Materials Research Society Symposium
City	San Francisco, California
Period	18/04/95 → 21/04/95

NREL Publication Number

@conference{c1889b78efc0450b9d734a355b6d54b8,

title = "Measurement of Two Deep H Bonding Levels in Device Quality Glow Discharge a-Si:H",

author = "NREL",

year = "1995",

language = "American English",

pages = "413--418",

note = "Amorphous Silicon Technology 1995: Materials Research Society Symposium ; Conference date: 18-04-1995 Through 21-04-1995",

}