Measurements of the Electron Density in n-type a-Si:H

Research output: Contribution to journal › Article

Original language	American English
Pages (from-to)	L19-L22
Journal	Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties
Volume	50
Issue number	3
DOIs	https://doi.org/10.1080/13642818408238852
State	Published - 1984

Work performed by Xerox Palo Alto Research Center, Palo Alto, California

NREL Publication Number

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title = "Measurements of the Electron Density in n-type a-Si:H",

author = "NREL",

note = "Work performed by Xerox Palo Alto Research Center, Palo Alto, California",

year = "1984",

doi = "10.1080/13642818408238852",

language = "American English",

volume = "50",

pages = "L19--L22",

journal = "Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties",

issn = "1364-2812",

publisher = "Taylor and Francis Ltd.",

number = "3",

}

TY - JOUR

T1 - Measurements of the Electron Density in n-type a-Si:H

AU - NREL, null

N1 - Work performed by Xerox Palo Alto Research Center, Palo Alto, California

PY - 1984

Y1 - 1984

U2 - 10.1080/13642818408238852

DO - 10.1080/13642818408238852

M3 - Article

SN - 1364-2812

VL - 50

SP - L19-L22

JO - Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties

JF - Philosophical Magazine B: Physics of Condensed Matter; Statistical Mechanics, Electronic, Optical and Magnetic Properties

IS - 3

ER -