Measuring Degradation Rates Without Irradiance Data

Steve Pulver, Daniel Cormode, Alex Cronin, Dirk Jordan, Sarah Kurtz, Ryan Smith

Research output: Contribution to conferencePaperpeer-review

14 Scopus Citations

Abstract

A method to report photovoltaic (PV) system degradation rates without using irradiance data is demonstrated. First, a set of relative degradation rates are determined by comparing daily AC final yields from a group of PV systems relative to the average final yield of all the PV systems. Then, the difference between relative and absolute degradation rates is found using a Bayesian statistical analysis. This approach is verified by comparing to methods that utilize irradiance data. This approach is significant because PV systems are often deployed without irradiance sensors, so the analysis method described here may enable measurements of degradation using data that were previously thought to be unsuitable for degradation studies.

Original languageAmerican English
Pages1271-1276
Number of pages6
DOIs
StatePublished - 2010
Event35th IEEE Photovoltaic Specialists Conference, PVSC 2010 - Honolulu, HI, United States
Duration: 20 Jun 201025 Jun 2010

Conference

Conference35th IEEE Photovoltaic Specialists Conference, PVSC 2010
Country/TerritoryUnited States
CityHonolulu, HI
Period20/06/1025/06/10

NREL Publication Number

  • NREL/CP-5200-50805

Keywords

  • degradation
  • photovoltaics
  • PV systems
  • solar

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