Abstract
Surface damage in a silicon wafer, produced by mechanical polishing or ion implantation, is shown to mediate diffusion of hydrogen from a molecular ambient such as a forming gas. Experimental results show that; the formation of a N+ region of a solar cell can produce significant surface stress similar to mechanical polishing. Results of hydrogen diffusion produced by forming gas annealing ofvarious commercial photovoltaic silicon substrates and cells are discussed.
| Original language | American English |
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| Number of pages | 7 |
| State | Published - 1997 |
| Event | 26th IEEE Photovoltaic Specialists Conference - Anaheim, California Duration: 29 Sep 1997 → 3 Oct 1997 |
Conference
| Conference | 26th IEEE Photovoltaic Specialists Conference |
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| City | Anaheim, California |
| Period | 29/09/97 → 3/10/97 |
NREL Publication Number
- NREL/CP-520-23578