Medium-Range Order in Hydrogenated Amorphous Silicon Measured by Fluctuation Microscopy

    Research output: Contribution to conferencePaper

    Original languageAmerican English
    Pages145-146
    Number of pages2
    StatePublished - 2000
    EventProgram and 2000 NCPV Program Review Meeting - Denver, Colorado
    Duration: 16 Apr 200019 Apr 2000

    Conference

    ConferenceProgram and 2000 NCPV Program Review Meeting
    CityDenver, Colorado
    Period16/04/0019/04/00

    NREL Publication Number

    • NREL/CP-520-35705

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