Metal-Insulator-Metal Diodes: Role of the Insulator Layer on the Rectification Performance

Prakash Periasamy, Harvey L. Guthrey, Aziz I. Abdulagatov, Paul F. Ndione, Joseph J. Berry, David S. Ginley, Steven M. George, Philip A. Parilla, Ryan P. O'Hayre

Research output: Contribution to journalArticlepeer-review

61 Scopus Citations

Abstract

A systematic study of the role of the insulator layer on rectification performance in metal-insulator-metal structures is reported. Four different MIM systems with Nb/Pt metal pairs and Nb2O5, TiO2, Al2O3, MgO as the insulator candidates are investigated based on an empirical hypothesis. As per the hypothesis and experimental verification, several prospective MIM systems such as Sm/ZrO2/Pt and Hf/TiO2/Pt are identified and a MIM materials-space is constructed.

Original languageAmerican English
Pages (from-to)1301-1308
Number of pages8
JournalAdvanced Materials
Volume25
Issue number9
DOIs
StatePublished - 2013

NREL Publication Number

  • NREL/JA-5200-58570

Keywords

  • AlO
  • MIM diodes
  • NbO
  • rectenna
  • TiO

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