Metal/Oxide/Semiconductor Interface Studies for MBE and LPE Grown GaAs Using AES and SIMS: (Abstract)

    Research output: Contribution to journalArticle

    Original languageAmerican English
    JournalBulletin of the American Physical Society
    Volume24
    Issue number3
    StatePublished - 1979

    NREL Publication Number

    • ACNR/JA-213-4856

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