Method to Measure Resistivity, Mobility, and Absorber Thickness in Thin-Film Solar Cells with Application to CdTe Devices

Xiaonon Li

Research output: Contribution to journal › Article › peer-review

Original language	American English
Pages (from-to)	2073-2077
Number of pages	5
Journal	Solar Energy Materials and Solar Cells
Volume	94
Issue number	12
DOIs	https://doi.org/10.1016/j.solmat.2010.06.018
State	Published - 2010

NREL Publication Number

@article{cd167622f9cb4f099e61c24e3792ba33,

title = "Method to Measure Resistivity, Mobility, and Absorber Thickness in Thin-Film Solar Cells with Application to CdTe Devices",

keywords = "absorber thickness, admittance spectroscopy, back contact, capacitance-voltage, CdTe, mobility",

author = "Xiaonon Li",

year = "2010",

doi = "10.1016/j.solmat.2010.06.018",

language = "American English",

volume = "94",

pages = "2073--2077",

journal = "Solar Energy Materials and Solar Cells",

issn = "0927-0248",

publisher = "Elsevier B.V.",

number = "12",

}

TY - JOUR

T1 - Method to Measure Resistivity, Mobility, and Absorber Thickness in Thin-Film Solar Cells with Application to CdTe Devices

AU - Li, Xiaonon

PY - 2010

Y1 - 2010

KW - absorber thickness

KW - admittance spectroscopy

KW - back contact

KW - capacitance-voltage

KW - CdTe

KW - mobility

U2 - 10.1016/j.solmat.2010.06.018

DO - 10.1016/j.solmat.2010.06.018

M3 - Article

SN - 0927-0248

VL - 94

SP - 2073

EP - 2077

JO - Solar Energy Materials and Solar Cells

JF - Solar Energy Materials and Solar Cells

IS - 12

ER -