Methodology to Predict Annual Yield Losses and Gains Caused by Solar Module Design and Materials under Field Exposure

Engineering

• Test Condition 100%
• Crystalline Silicon 100%
• Module Design 100%
• Solar Cell 100%
• Reflection Loss 50%
• High Wind Speed 50%
• Photovoltaic Modules 50%
• Temperature Data 50%
• Design Condition 50%
• Ohmic Loss 50%
• Electrical Effect 50%
• Surface Increase 50%
• Diffuse Light 50%
• Heterojunctions 50%
• Irradiance 50%
• Operating Temperature 50%
• Light Source 50%
• Thermal Effect 50%