Methods for Analysis of Two-Junction, Two-Terminal Photovoltaic Devices

Sarah R. Kurtz; K. Emery; J. M. Olson

doi:10.1109/WCPEC.1994.520553

Methods for Analysis of Two-Junction, Two-Terminal Photovoltaic Devices

Sarah R. Kurtz, K. Emery, J. M. Olson

National Renewable Energy Laboratory

Research output: Contribution to conference › Paper › peer-review

48 Scopus Citations

Abstract

Accurate measurement techniques are essential to the advancement of photovoltaic device technologies. Measurements of multi-junction, two-terminal devices are especially difficult because researchers need to be able to characterize the individual cells but are unable to connect directly to them. We describe here a single-source simulator (with large-area filters) method for obtaining current-voltage (I-V) curves of both the individual cells and the tandem cell for arbitrary spectra. The filters used for the I-V measurements and for quantum efficiency (QE) measurements are somewhat different. Voltage biasing for QE measurements is useful when one cell is shunted or has a small reverse breakdown voltage, but is often unnecessary for III-V devices.

Original language	American English
Pages	1733-1737
Number of pages	5
DOIs	https://doi.org/10.1109/WCPEC.1994.520553
State	Published - 1994
Event	Proceedings of the 24th IEEE Photovoltaic Specialists Conference. Part 2 (of 2) - Waikoloa, HI, USA Duration: 5 Dec 1994 → 9 Dec 1994

Conference

Conference	Proceedings of the 24th IEEE Photovoltaic Specialists Conference. Part 2 (of 2)
City	Waikoloa, HI, USA
Period	5/12/94 → 9/12/94

NREL Publication Number

NREL/CP-451-7427

Access to Document

10.1109/WCPEC.1994.520553

Cite this

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year = "1994",

doi = "10.1109/WCPEC.1994.520553",

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AU - Kurtz, Sarah R.

AU - Emery, K.

AU - Olson, J. M.

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N2 - Accurate measurement techniques are essential to the advancement of photovoltaic device technologies. Measurements of multi-junction, two-terminal devices are especially difficult because researchers need to be able to characterize the individual cells but are unable to connect directly to them. We describe here a single-source simulator (with large-area filters) method for obtaining current-voltage (I-V) curves of both the individual cells and the tandem cell for arbitrary spectra. The filters used for the I-V measurements and for quantum efficiency (QE) measurements are somewhat different. Voltage biasing for QE measurements is useful when one cell is shunted or has a small reverse breakdown voltage, but is often unnecessary for III-V devices.

AB - Accurate measurement techniques are essential to the advancement of photovoltaic device technologies. Measurements of multi-junction, two-terminal devices are especially difficult because researchers need to be able to characterize the individual cells but are unable to connect directly to them. We describe here a single-source simulator (with large-area filters) method for obtaining current-voltage (I-V) curves of both the individual cells and the tandem cell for arbitrary spectra. The filters used for the I-V measurements and for quantum efficiency (QE) measurements are somewhat different. Voltage biasing for QE measurements is useful when one cell is shunted or has a small reverse breakdown voltage, but is often unnecessary for III-V devices.

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DO - 10.1109/WCPEC.1994.520553

M3 - Paper

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T2 - Proceedings of the 24th IEEE Photovoltaic Specialists Conference. Part 2 (of 2)

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ER -

Methods for Analysis of Two-Junction, Two-Terminal Photovoltaic Devices

Abstract

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