Meyer-Neldel Rule and the Influence of Entropy on Capture Cross-Section Determination in Cu(In,Ga)Se2

Jehad A.M. Abushama; S. W. Johnston; R. S. Crandall; R. Noufi

doi:10.1063/1.2051796

Meyer-Neldel Rule and the Influence of Entropy on Capture Cross-Section Determination in Cu(In,Ga)Se2

Jehad A.M. Abushama, S. W. Johnston, R. S. Crandall, R. Noufi

Materials Science

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14 Scopus Citations

Abstract

We use deep-level transient spectroscopy (DLTS) to investigate the electronic properties of ZnOCdS Cux In1-y Gay Se2 Mo soda-lime glass thin-film solar cells. We deposited films with different x and y values using elemental evaporation. Devices made from these films exhibit more than 40 hole and electron traps, with activation energies ranging from 0.07 to 1.17 eV. Standard DLTS analysis (which assumes that entropy changes can be neglected) gives apparent capture cross sections that vary by 18 orders of magnitude over this energy range. All our data show that the charge-carrier emission rate obeys the Meyer-Neldel rule (MNR) with an isokinetic temperature of 340±30 K. By including the MNR relation in detailed balance, we show that there is a single cross section for all the traps.

Original language	American English
Article number	123502
Pages (from-to)	1-3
Number of pages	3
Journal	Applied Physics Letters
Volume	87
Issue number	12
DOIs	https://doi.org/10.1063/1.2051796 https://doi.org/10.1063/1.2051796
State	Published - 19 Sep 2005

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NREL/JA-520-38029

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title = "Meyer-Neldel Rule and the Influence of Entropy on Capture Cross-Section Determination in Cu(In,Ga)Se2",

abstract = "We use deep-level transient spectroscopy (DLTS) to investigate the electronic properties of ZnOCdS Cux In1-y Gay Se2 Mo soda-lime glass thin-film solar cells. We deposited films with different x and y values using elemental evaporation. Devices made from these films exhibit more than 40 hole and electron traps, with activation energies ranging from 0.07 to 1.17 eV. Standard DLTS analysis (which assumes that entropy changes can be neglected) gives apparent capture cross sections that vary by 18 orders of magnitude over this energy range. All our data show that the charge-carrier emission rate obeys the Meyer-Neldel rule (MNR) with an isokinetic temperature of 340±30 K. By including the MNR relation in detailed balance, we show that there is a single cross section for all the traps.",

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AU - Abushama, Jehad A.M.

AU - Johnston, S. W.

AU - Crandall, R. S.

AU - Noufi, R.

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N2 - We use deep-level transient spectroscopy (DLTS) to investigate the electronic properties of ZnOCdS Cux In1-y Gay Se2 Mo soda-lime glass thin-film solar cells. We deposited films with different x and y values using elemental evaporation. Devices made from these films exhibit more than 40 hole and electron traps, with activation energies ranging from 0.07 to 1.17 eV. Standard DLTS analysis (which assumes that entropy changes can be neglected) gives apparent capture cross sections that vary by 18 orders of magnitude over this energy range. All our data show that the charge-carrier emission rate obeys the Meyer-Neldel rule (MNR) with an isokinetic temperature of 340±30 K. By including the MNR relation in detailed balance, we show that there is a single cross section for all the traps.

AB - We use deep-level transient spectroscopy (DLTS) to investigate the electronic properties of ZnOCdS Cux In1-y Gay Se2 Mo soda-lime glass thin-film solar cells. We deposited films with different x and y values using elemental evaporation. Devices made from these films exhibit more than 40 hole and electron traps, with activation energies ranging from 0.07 to 1.17 eV. Standard DLTS analysis (which assumes that entropy changes can be neglected) gives apparent capture cross sections that vary by 18 orders of magnitude over this energy range. All our data show that the charge-carrier emission rate obeys the Meyer-Neldel rule (MNR) with an isokinetic temperature of 340±30 K. By including the MNR relation in detailed balance, we show that there is a single cross section for all the traps.

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Meyer-Neldel Rule and the Influence of Entropy on Capture Cross-Section Determination in Cu(In,Ga)Se2

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