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Micro- to Nano-Characterization of Semiconductor Grain Boundaries
Lawrence L. Kazmerski
Materials Science
Research output
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Contribution to journal
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Article
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peer-review
6
Scopus Citations
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Dive into the research topics of 'Micro- to Nano-Characterization of Semiconductor Grain Boundaries'. Together they form a unique fingerprint.
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Material Science
Grain Boundary
100%
Structure (Composition)
25%
Photoluminescence
25%
Secondary Ion Mass Spectrometry
25%
Electronic Property
25%
Surface Analysis
25%
Auger Electron Spectroscopy
25%
Scanning Tunneling Microscopy
25%
Chemical Processing
25%