Abstract
Applications of complementary surface analysis techniques to solar cell device problems are discussed. Several examples of device interface and grain boundary problems are presented. Silicon, gallium arsenide and indium phosphide based devices are reviewed. Results of compositional and chemical analysis are correlated directly with Electric Bombardment Induced Conductivity (EBIC) measurements performed in-situ on identical sample areas. Those are, in turn, correlated with resulting photovoltaic device performance. The importance of microanalysis to the solution of critical device problems in the photovoltaics technology is emphasized.
| Original language | American English |
|---|---|
| Pages | 132-137 |
| Number of pages | 6 |
| State | Published - 1980 |
| Externally published | Yes |
| Event | Role of Electro-Optics in Photovoltaic Energy Conversion - San Diego, California Duration: 31 Jul 1980 → 1 Aug 1980 |
Conference
| Conference | Role of Electro-Optics in Photovoltaic Energy Conversion |
|---|---|
| City | San Diego, California |
| Period | 31/07/80 → 1/08/80 |
NREL Publication Number
- ACNR/CP-213-3819
