Microcharacterization of CdTe Films Deposited by Close-Spaced Sublimation

R. J. Matson; F. S. Hasoon; K. M. Jones; M. M. Al‐Jassim; R. D. Tomlinson

doi:10.1002/pip.4670020303

Microcharacterization of CdTe Films Deposited by Close-Spaced Sublimation

R. J. Matson, F. S. Hasoon, K. M. Jones, M. M. Al‐Jassim, R. D. Tomlinson

Materials Science

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Abstract

Microcharacterization of the luminescent, structural, electrical and topographical properties of thin films of close‐spaced sublimation (CSS)‐fabricated CdTe was performed. the film morphology was found to be dependent on the film thickness, deposition conditions and post‐deposition treatment. the complementary use of electron beam‐induced current (EBIC) and cathodoluminescence (CL) analysis in the scanning electron microscope demonstrated large inter‐ and intragrain inhomogeneities in the luminescent and electrical properties of the films. Follow‐on plan‐view examinations with the transmission electron microscope revealed varying densities of structural dejects, such as stacking faults and threading dislocations, which could explain the variations observed in the CL and EBIC images. Consisting primarily of experimental observations and comments, this report is phenomenological in nature.

Original language	American English
Pages (from-to)	203-209
Number of pages	7
Journal	Progress in Photovoltaics: Research and Applications
Volume	2
Issue number	3
DOIs	https://doi.org/10.1002/pip.4670020303 https://doi.org/10.1002/pip.4670020303
State	Published - 1994

NREL Publication Number

NREL/JA-412-6220

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title = "Microcharacterization of CdTe Films Deposited by Close-Spaced Sublimation",

abstract = "Microcharacterization of the luminescent, structural, electrical and topographical properties of thin films of close‐spaced sublimation (CSS)‐fabricated CdTe was performed. the film morphology was found to be dependent on the film thickness, deposition conditions and post‐deposition treatment. the complementary use of electron beam‐induced current (EBIC) and cathodoluminescence (CL) analysis in the scanning electron microscope demonstrated large inter‐ and intragrain inhomogeneities in the luminescent and electrical properties of the films. Follow‐on plan‐view examinations with the transmission electron microscope revealed varying densities of structural dejects, such as stacking faults and threading dislocations, which could explain the variations observed in the CL and EBIC images. Consisting primarily of experimental observations and comments, this report is phenomenological in nature.",

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T1 - Microcharacterization of CdTe Films Deposited by Close-Spaced Sublimation

AU - Matson, R. J.

AU - Hasoon, F. S.

AU - Jones, K. M.

AU - Al‐Jassim, M. M.

AU - Tomlinson, R. D.

PY - 1994

Y1 - 1994

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AB - Microcharacterization of the luminescent, structural, electrical and topographical properties of thin films of close‐spaced sublimation (CSS)‐fabricated CdTe was performed. the film morphology was found to be dependent on the film thickness, deposition conditions and post‐deposition treatment. the complementary use of electron beam‐induced current (EBIC) and cathodoluminescence (CL) analysis in the scanning electron microscope demonstrated large inter‐ and intragrain inhomogeneities in the luminescent and electrical properties of the films. Follow‐on plan‐view examinations with the transmission electron microscope revealed varying densities of structural dejects, such as stacking faults and threading dislocations, which could explain the variations observed in the CL and EBIC images. Consisting primarily of experimental observations and comments, this report is phenomenological in nature.

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Microcharacterization of CdTe Films Deposited by Close-Spaced Sublimation

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