Microcharacterization of CdTe Films Deposited by Close-Spaced Sublimation

R. J. Matson, F. S. Hasoon, K. M. Jones, M. M. Al‐Jassim, R. D. Tomlinson

Research output: Contribution to journalArticlepeer-review

1 Scopus Citations


Microcharacterization of the luminescent, structural, electrical and topographical properties of thin films of close‐spaced sublimation (CSS)‐fabricated CdTe was performed. the film morphology was found to be dependent on the film thickness, deposition conditions and post‐deposition treatment. the complementary use of electron beam‐induced current (EBIC) and cathodoluminescence (CL) analysis in the scanning electron microscope demonstrated large inter‐ and intragrain inhomogeneities in the luminescent and electrical properties of the films. Follow‐on plan‐view examinations with the transmission electron microscope revealed varying densities of structural dejects, such as stacking faults and threading dislocations, which could explain the variations observed in the CL and EBIC images. Consisting primarily of experimental observations and comments, this report is phenomenological in nature.

Original languageAmerican English
Pages (from-to)203-209
Number of pages7
JournalProgress in Photovoltaics: Research and Applications
Issue number3
StatePublished - 1994

NREL Publication Number

  • NREL/JA-412-6220


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