Microscopic Analysis of Residuals on Polycrystalline CdTe Following Wet CdCl2 Treatment

Timothy A. Gessert; Manuel J. Romero; Craig L. Perkins; Sally E. Asher; Rick Matson; Helio Moutinho; Doug Rose

doi:10.1557/proc-668-h1.10

Microscopic Analysis of Residuals on Polycrystalline CdTe Following Wet CdCl2 Treatment

Timothy A. Gessert, Manuel J. Romero, Craig L. Perkins, Sally E. Asher, Rick Matson, Helio Moutinho, Doug Rose

Materials Science

National Renewable Energy Laboratory

Research output: Contribution to conference › Paper › peer-review

16 Scopus Citations

Abstract

In this study we report on the spatial distribution and composition of residuals on the CdTe surface following a typical wet CdCl₂ treatment, and the effect that our ion-beam milling has on this residual-coated surface. Results show that residuals are spatially discrete, located primarily along grain boundaries, and are likely a cadmium oxychloride. Results also show that the residuals may penetrate deep into the CdTe surface such that typical ion-beam milling procedures do not produce complete residual removal.

Original language	American English
Pages	H1101-H1106
DOIs	https://doi.org/10.1557/proc-668-h1.10
State	Published - 2001
Event	II-IV Compound Semiconductor Photovoltaic Materials: Materials Research Society Symposium - San Francisco, California Duration: 16 Apr 2001 → 20 Apr 2001

Conference

Conference	II-IV Compound Semiconductor Photovoltaic Materials: Materials Research Society Symposium
City	San Francisco, California
Period	16/04/01 → 20/04/01

NREL Publication Number

NREL/CP-520-30112

Access to Document

10.1557/proc-668-h1.10

Cite this

Gessert, T. A., Romero, M. J., Perkins, C. L., Asher, S. E., Matson, R., Moutinho, H., & Rose, D. (2001). Microscopic Analysis of Residuals on Polycrystalline CdTe Following Wet CdCl2 Treatment. H1101-H1106. Paper presented at II-IV Compound Semiconductor Photovoltaic Materials: Materials Research Society Symposium, San Francisco, California. https://doi.org/10.1557/proc-668-h1.10

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title = "Microscopic Analysis of Residuals on Polycrystalline CdTe Following Wet CdCl2 Treatment",

abstract = "In this study we report on the spatial distribution and composition of residuals on the CdTe surface following a typical wet CdCl2 treatment, and the effect that our ion-beam milling has on this residual-coated surface. Results show that residuals are spatially discrete, located primarily along grain boundaries, and are likely a cadmium oxychloride. Results also show that the residuals may penetrate deep into the CdTe surface such that typical ion-beam milling procedures do not produce complete residual removal.",

author = "Gessert, {Timothy A.} and Romero, {Manuel J.} and Perkins, {Craig L.} and Asher, {Sally E.} and Rick Matson and Helio Moutinho and Doug Rose",

year = "2001",

doi = "10.1557/proc-668-h1.10",

language = "American English",

pages = "H1101--H1106",

note = "II-IV Compound Semiconductor Photovoltaic Materials: Materials Research Society Symposium ; Conference date: 16-04-2001 Through 20-04-2001",

}

Gessert, TA, Romero, MJ, Perkins, CL, Asher, SE, Matson, R, Moutinho, H & Rose, D 2001, 'Microscopic Analysis of Residuals on Polycrystalline CdTe Following Wet CdCl2 Treatment', Paper presented at II-IV Compound Semiconductor Photovoltaic Materials: Materials Research Society Symposium, San Francisco, California, 16/04/01 - 20/04/01 pp. H1101-H1106. https://doi.org/10.1557/proc-668-h1.10

Microscopic Analysis of Residuals on Polycrystalline CdTe Following Wet CdCl2 Treatment. / Gessert, Timothy A.; Romero, Manuel J.; Perkins, Craig L. et al.
2001. H1101-H1106 Paper presented at II-IV Compound Semiconductor Photovoltaic Materials: Materials Research Society Symposium, San Francisco, California.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - Microscopic Analysis of Residuals on Polycrystalline CdTe Following Wet CdCl2 Treatment

AU - Gessert, Timothy A.

AU - Romero, Manuel J.

AU - Perkins, Craig L.

AU - Asher, Sally E.

AU - Matson, Rick

AU - Moutinho, Helio

AU - Rose, Doug

PY - 2001

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AB - In this study we report on the spatial distribution and composition of residuals on the CdTe surface following a typical wet CdCl2 treatment, and the effect that our ion-beam milling has on this residual-coated surface. Results show that residuals are spatially discrete, located primarily along grain boundaries, and are likely a cadmium oxychloride. Results also show that the residuals may penetrate deep into the CdTe surface such that typical ion-beam milling procedures do not produce complete residual removal.

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DO - 10.1557/proc-668-h1.10

M3 - Paper

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Microscopic Analysis of Residuals on Polycrystalline CdTe Following Wet CdCl2 Treatment

Abstract

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NREL Publication Number

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