Microscopic Analysis of Residuals on Polycrystalline CdTe Following Wet CdCl2 Treatment

Timothy A. Gessert; Manuel J. Romero; Craig L. Perkins; Sally E. Asher; Rick Matson; Helio Moutinho; Doug Rose

doi:10.1557/proc-668-h1.10

Microscopic Analysis of Residuals on Polycrystalline CdTe Following Wet CdCl2 Treatment

Timothy A. Gessert
, Manuel J. Romero
, Craig L. Perkins
, Sally E. Asher
, Rick Matson
, Helio Moutinho
, Doug Rose

Materials Science

National Renewable Energy Laboratory

Research output: Contribution to conference › Paper › peer-review

16 Scopus Citations

Abstract

In this study we report on the spatial distribution and composition of residuals on the CdTe surface following a typical wet CdCl₂ treatment, and the effect that our ion-beam milling has on this residual-coated surface. Results show that residuals are spatially discrete, located primarily along grain boundaries, and are likely a cadmium oxychloride. Results also show that the residuals may penetrate deep into the CdTe surface such that typical ion-beam milling procedures do not produce complete residual removal.

Original language	American English
Pages	H1101-H1106
DOIs	https://doi.org/10.1557/proc-668-h1.10
State	Published - 2001
Event	II-IV Compound Semiconductor Photovoltaic Materials: Materials Research Society Symposium - San Francisco, California Duration: 16 Apr 2001 → 20 Apr 2001

Conference

Conference	II-IV Compound Semiconductor Photovoltaic Materials: Materials Research Society Symposium
City	San Francisco, California
Period	16/04/01 → 20/04/01

NLR Publication Number

NREL/CP-520-30112

Access to Document

10.1557/proc-668-h1.10

Cite this

Gessert, T. A., Romero, M. J., Perkins, C. L., Asher, S. E., Matson, R., Moutinho, H., & Rose, D. (2001). Microscopic Analysis of Residuals on Polycrystalline CdTe Following Wet CdCl2 Treatment. H1101-H1106. Paper presented at II-IV Compound Semiconductor Photovoltaic Materials: Materials Research Society Symposium, San Francisco, California. https://doi.org/10.1557/proc-668-h1.10

@conference{2e5f0b6664ea4c9b94dddba1b559ea95,

title = "Microscopic Analysis of Residuals on Polycrystalline CdTe Following Wet CdCl2 Treatment",

abstract = "In this study we report on the spatial distribution and composition of residuals on the CdTe surface following a typical wet CdCl2 treatment, and the effect that our ion-beam milling has on this residual-coated surface. Results show that residuals are spatially discrete, located primarily along grain boundaries, and are likely a cadmium oxychloride. Results also show that the residuals may penetrate deep into the CdTe surface such that typical ion-beam milling procedures do not produce complete residual removal.",

author = "Gessert, \{Timothy A.\} and Romero, \{Manuel J.\} and Perkins, \{Craig L.\} and Asher, \{Sally E.\} and Rick Matson and Helio Moutinho and Doug Rose",

year = "2001",

doi = "10.1557/proc-668-h1.10",

language = "American English",

pages = "H1101--H1106",

note = "II-IV Compound Semiconductor Photovoltaic Materials: Materials Research Society Symposium ; Conference date: 16-04-2001 Through 20-04-2001",

}

Gessert, TA, Romero, MJ, Perkins, CL, Asher, SE, Matson, R, Moutinho, H & Rose, D 2001, 'Microscopic Analysis of Residuals on Polycrystalline CdTe Following Wet CdCl2 Treatment', Paper presented at II-IV Compound Semiconductor Photovoltaic Materials: Materials Research Society Symposium, San Francisco, California, 16/04/01 - 20/04/01 pp. H1101-H1106. https://doi.org/10.1557/proc-668-h1.10

Microscopic Analysis of Residuals on Polycrystalline CdTe Following Wet CdCl2 Treatment. / Gessert, Timothy A.; Romero, Manuel J.; Perkins, Craig L. et al.
2001. H1101-H1106 Paper presented at II-IV Compound Semiconductor Photovoltaic Materials: Materials Research Society Symposium, San Francisco, California.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - Microscopic Analysis of Residuals on Polycrystalline CdTe Following Wet CdCl2 Treatment

AU - Gessert, Timothy A.

AU - Romero, Manuel J.

AU - Perkins, Craig L.

AU - Asher, Sally E.

AU - Matson, Rick

AU - Moutinho, Helio

AU - Rose, Doug

PY - 2001

Y1 - 2001

N2 - In this study we report on the spatial distribution and composition of residuals on the CdTe surface following a typical wet CdCl2 treatment, and the effect that our ion-beam milling has on this residual-coated surface. Results show that residuals are spatially discrete, located primarily along grain boundaries, and are likely a cadmium oxychloride. Results also show that the residuals may penetrate deep into the CdTe surface such that typical ion-beam milling procedures do not produce complete residual removal.

AB - In this study we report on the spatial distribution and composition of residuals on the CdTe surface following a typical wet CdCl2 treatment, and the effect that our ion-beam milling has on this residual-coated surface. Results show that residuals are spatially discrete, located primarily along grain boundaries, and are likely a cadmium oxychloride. Results also show that the residuals may penetrate deep into the CdTe surface such that typical ion-beam milling procedures do not produce complete residual removal.

UR - https://www.scopus.com/pages/publications/0035557039

U2 - 10.1557/proc-668-h1.10

DO - 10.1557/proc-668-h1.10

M3 - Paper

AN - SCOPUS:0035557039

SP - H1101-H1106

T2 - II-IV Compound Semiconductor Photovoltaic Materials: Materials Research Society Symposium

Y2 - 16 April 2001 through 20 April 2001

ER -

Microscopic Analysis of Residuals on Polycrystalline CdTe Following Wet CdCl2 Treatment

Abstract

Conference

NLR Publication Number

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