Microscopic Origins of Metastable Effects in a-Si:H and Deep Defect Characterization in a-Si,Ge:H Alloys, Annual Subcontract Report, 1 February 1991 - 31 January 1992

doi:10.2172/7233282

Microscopic Origins of Metastable Effects in a-Si:H and Deep Defect Characterization in a-Si,Ge:H Alloys, Annual Subcontract Report, 1 February 1991 - 31 January 1992

NREL

Research output: NLR › Subcontract Report

Original language	American English
Number of pages	29
DOIs	https://doi.org/10.2172/7233282
State	Published - 1992

Bibliographical note

Work performed by the University of Oregon, Eugene, Oregon

NLR Publication Number

NREL/TP-451-4938

Keywords

amorphous silicon
characterization
defects
photovoltaics
solar cells

Access to Document

10.2172/7233282

https://www.nrel.gov/docs/legosti/old/4938.pdf

Cite this

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title = "Microscopic Origins of Metastable Effects in a-Si:H and Deep Defect Characterization in a-Si,Ge:H Alloys, Annual Subcontract Report, 1 February 1991 - 31 January 1992",

keywords = "amorphous silicon, characterization, defects, photovoltaics, solar cells",

author = "NREL",

note = "Work performed by the University of Oregon, Eugene, Oregon",

year = "1992",

doi = "10.2172/7233282",

language = "American English",

type = "Other",

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PY - 1992

Y1 - 1992

KW - amorphous silicon

KW - characterization

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KW - solar cells

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DO - 10.2172/7233282

M3 - Subcontract Report

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