Microscopic Real-Space Resistance Mapping Across CdTe Solar Cell Junctions by Scanning Spreading Resistance Microscopy

Huan Li, Chun Sheng Jiang, Wyatt K. Metzger, Chih Kang Shih, Mowafak Al-Jassim

Research output: Contribution to journalArticlepeer-review

10 Scopus Citations

Abstract

We report on scanning spreading resistance microscopy on cross sections of thin-film CdTe devices. The results show the capability of identifying the multiple layers, the depletion region, and the nonuniform doping. We observe carrier injection and depletion region movement by laser illumination or by electrically biasing the device, directly revealing the underlying physics of the solar cell junction in real space with resolutions of nanometer scale.

Original languageAmerican English
Article number6939652
Pages (from-to)395-400
Number of pages6
JournalIEEE Journal of Photovoltaics
Volume5
Issue number1
DOIs
StatePublished - 2015

Bibliographical note

Publisher Copyright:
© 2014 IEEE.

NREL Publication Number

  • NREL/JA-5K00-63069

Keywords

  • CdTe
  • microelectrical property
  • scanning spreading resistance microscopy (SRRM)
  • solar cell junction
  • Thin-film PV

Fingerprint

Dive into the research topics of 'Microscopic Real-Space Resistance Mapping Across CdTe Solar Cell Junctions by Scanning Spreading Resistance Microscopy'. Together they form a unique fingerprint.

Cite this