Microstructure and Surface Chemistry of Nanoporous 'Black Silicon' for Photovoltaics

Yanfa Yan, Hao Chih Yuan, Vernon E. Yost, Kim Jones, Mowafak Al-Jassim, Howard M. Branz

Research output: Contribution to conferencePaperpeer-review

6 Scopus Citations

Abstract

We report our detailed investigation of the microstructure and surface chemistry of nanoporous black Si layers using transmission electron microscopy techniques. We find that the one-step nanoparticle-catalyzed liquid etch creates deep conical nanovoids. The cones provide the density-graded surface that suppresses reflection. The surface of the as-etched nanoporous black Si is an amorphous Si suboxide (SiOx) produced by the strongly oxidizing nanocatalyzed etch. The oxygen concentration decreases monotonically away from the nanovoid surface. This suboxide tends to be thinner near the cone tip than nearer to the wafer surface. The c-Si/suboxide interface is rough at the nanometer scale. Diffraction contrast reveals a high density of point defects in the c-Si near the c-Si/suboxide interface. These features account for the poor blue response of as-etched black Si solar cells. The passivation treatment is seen to convert the Si suboxide quite completely into SiO2 with a smooth c-Si/SiO2 interface. These changes are essential to achieve our 16.8%-efficient solar cells.

Original languageAmerican English
Pages2255-2257
Number of pages3
DOIs
StatePublished - 2010
Event35th IEEE Photovoltaic Specialists Conference, PVSC 2010 - Honolulu, HI, United States
Duration: 20 Jun 201025 Jun 2010

Conference

Conference35th IEEE Photovoltaic Specialists Conference, PVSC 2010
Country/TerritoryUnited States
CityHonolulu, HI
Period20/06/1025/06/10

NREL Publication Number

  • NREL/CP-520-47600

Keywords

  • surface passivation
  • transmission electron microscopy

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