Microstructure of Amorphous-Silicon-Based Solar Cell Materials by Small-Angle X-Ray Scattering: Annual Technical Report, 6 April 1995 - 5 April 1996

The general objective of this research is to provide detailed microstructural information on the amorphous-silicon-based, thin-film materials under development for improved multijunction solar cells. Correlation of this microstructure with opto-electronic properties and device performance is an integral part of the research. The experimental technique used is small-angle x-ray scattering, and itprovides quantitative microstructural data on microvoid fractions, sizes, shapes, and their preferred orientations. Other microstructural features such as alloy segregation, hydrogen-rich clusters, and alloy short-range order are probed. Three types of material are under investigation and fall into the bandgap classification scheme forming the basis of three of the four NREL Amorphous SiliconTeams.