Abstract
We report on our investigation of the microstructure and composition of the surface of CdTe films after mixed nitric and phosphoric (NP) acids etching, (HgTe, CuTe)-graphite pasting, and thermal annealing. We find that after this process, a thin layer of CdxHg1-xTe forms between the CdTe and Te-rich layers, giving a structure of CdTe/CdxHg 1-xTe/Te. High-resolution electron microscopy reveals that the CdxHg1-xTe layer has an epitaxial relationship with the CdTe. Bromine/methanol-etched samples or samples with intentionally deposited Te layers do not form the CdxHg1-xTe layer after (HgTe, CuTe)-graphite pasting and thermal annealing, indicating that they cannot act as fully as the NP etching.
Original language | American English |
---|---|
Pages (from-to) | 291-296 |
Number of pages | 6 |
Journal | Thin Solid Films |
Volume | 472 |
Issue number | 1-2 |
DOIs | |
State | Published - 2005 |
NREL Publication Number
- NREL/JA-520-36528
Keywords
- CdTe
- Interface structure
- Solar cells
- Transmisson electron microscopy