Microstructure of Compositionally Modulated InAlAs

Research output: Contribution to conferencePaper


We have observed spontaneous, lateral composition modulation in tensile InAlAs alloy films grown as short-period superlattices on InP (001). We have analyzed these films using transmission electron microscopy, x-ray reciprocal space mapping, and polarized photoluminescence spectroscopy. We find the growth front is nonplanar, exhibiting approx. 2 nm deep cusps aligned with the In-rich regions ofthe compositionally modulated films. In addition to the measured 15 nm wavelength modulation in the [110] direction, a modulation of 30 nm wavelength is seen in the orthogonal [1..hivin.1..0] direction. The photoluminescence from the modulated layer is strongly polarized and red shifted by 0.22 eV.
Original languageAmerican English
Number of pages6
StatePublished - 1997
EventThin Films Structure and Morphology: Materials Research Society Symposium - Boston, Massachusetts
Duration: 2 Dec 19966 Dec 1996


ConferenceThin Films Structure and Morphology: Materials Research Society Symposium
CityBoston, Massachusetts

NREL Publication Number

  • NREL/CP-590-24534


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