Abstract
We have observed spontaneous, lateral composition modulation in tensile InAlAs alloy films grown as short-period superlattices on InP (001). We have analyzed these films using transmission electron microscopy, x-ray reciprocal space mapping, and polarized photoluminescence spectroscopy. We find the growth front is nonplanar, exhibiting approx. 2 nm deep cusps aligned with the In-rich regions ofthe compositionally modulated films. In addition to the measured 15 nm wavelength modulation in the [110] direction, a modulation of 30 nm wavelength is seen in the orthogonal [1..hivin.1..0] direction. The photoluminescence from the modulated layer is strongly polarized and red shifted by 0.22 eV.
| Original language | American English |
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| Pages | 187-192 |
| Number of pages | 6 |
| State | Published - 1997 |
| Event | Thin Films Structure and Morphology: Materials Research Society Symposium - Boston, Massachusetts Duration: 2 Dec 1996 → 6 Dec 1996 |
Conference
| Conference | Thin Films Structure and Morphology: Materials Research Society Symposium |
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| City | Boston, Massachusetts |
| Period | 2/12/96 → 6/12/96 |
NREL Publication Number
- NREL/CP-590-24534