Abstract
AlxGa1-xAs (x>0.30) double heterostructures are grown by molecular-beam epitaxy (MBE) and the minority-carrier lifetimes are measured by time-resolved photoluminescence. The data indicate that the minority-carrier lifetimes in high aluminum (x>0.30) AlxGa 1-xAs grown by MBE are comparable to the previously published lifetimes of material grown by liquid-phase epitaxy. The lifetimes in MBE materials appear to be somewhat larger than those measured in materials grown by metalorganic chemical vapor deposition. Factors affecting AlGaAs minority-carrier lifetime, such as the growth temperature, the aluminum concentration, and the confinement layer composition will be discussed.
| Original language | American English |
|---|---|
| Pages (from-to) | 3094-3096 |
| Number of pages | 3 |
| Journal | Journal of Applied Physics |
| Volume | 69 |
| Issue number | 5 |
| DOIs | |
| State | Published - 1991 |
Bibliographical note
Work performed by Solar Energy Research Institute, Golden, Colorado, and Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, Urbana, IllinoisNLR Publication Number
- ACNR/JA-213-11891