Modeling Emissivity of Rough and Textured Silicon Wafers

Research output: Contribution to journalArticlepeer-review

Abstract

A method for calculating the emissivity of Si wafers with planar and nonplanar (such as rough or textured) surface morphologies is described. The technique is similar to that used in modeling of light trapping in solar cells and is also applicable to those cases when the wafer may have thin dielectric or metal layers. A software package is developed that uses this method. This package includes anapproach for calculating the refractive index and absorption coefficient as a function of wavelength, for various temperatures and dopant concentrations. We present results for a number of cases to demonstrate the applications of this model.
Original languageAmerican English
Pages (from-to)1341-1346
Number of pages6
JournalJournal of Electronic Materials
Volume27
Issue number12
DOIs
StatePublished - 1998

NREL Publication Number

  • NREL/JA-520-25604

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